Editorial Board
Editor-in-Chief
Yang Hao, Queen Mary, University of London
Associate Editors
Andrea Alu, University of Texas at Austin, USA
Runhua Fan, Shanghai Maritime University and Chinese Metamaterials Society, China
Maria Kafesaki, University of Crete, Greece
Jensen Li, University of Birmingham, UK
Editorial Board
Christos Argyropoulos, University of Nebraska-Lincoln, USA, website
Pavel Belov, ITMO, Russia
Filiberto Bilotti, University of Roma Tre, Italy
Tiejun Cui, Southeast University, China
Yijun Feng, Nanjing University, China
Sebastien Guenneau, Imperial College London, United Kingdom
Alastair Hibbins, University of Exeter, UK
Qing HouUniversity of Shanghai for Science and Technology, China
Mikhail Lapine, University of Technology Sydney, Australia
Tao Li, Nanjing University, China, website
Yongmin Liu, Northeastern University, USA
Alessio Monti, Niccolò Cusano University, Italy, website
Giacomo Oliveri, University of Trento, Italy
Carsten Rockstuhl, University of Jena, Germany
Hongyu Shi, Xi'an Jiaotong University, China
Wenxuan Tang, Southeast University, China
Stefano Vellucci, Niccolò Cusano University, Italy
Kaikai Xu, State Key Laboratory of Electronic Thin Films and Integrated Devices, China
Junming Zhao, Nanjing University, China
Advisory Board
Jeremy Baumberg, University of Cambridge, UK
Federico Capasso, Harvard University, USA
C.T. Chan, HKUST, Hong Kong, China
George Eleftheriades, University of Toronto, Canada
Nader Engheta, University of Pennsylvania, USA
Ulf Leonhardt, Weizmann Institute of Science, Israel
Raj Mittra, Penn State University, USA
John Pendry, Imperial College, London
Roy Sambles, University of Exeter, UK
Vladimir M. Shalaev, Purdue University, USA
David Smith, Duke University, USA
Costas Soukoulis, Iowa State University, USA
Sergei Tretyakov, Aalto University, Finland
Martin Wegener, Karlsruhe Institute of Technology, Germany
Anatoly V. Zayats, King’s College London, UK
Xiang Zhang, University of California at Berkeley, USA
Nikolay I. Zheludev, University of Southampton, UK
Richard W. Ziolkowski, University of Arizona, USA